This is the application version of the Trace Analyzer. For on-line usage, please visit the applet version. To get a peek at the tool, click the link to a screenshots of the Layer Stackup Editor, Trace Editor (coupled microstrips, coupled striplines, a pair of coplanar traces, and multiple traces coupled through a slot), and the data view of the RLGC matrices. Here are some of the features offered by the tool:
- Integrated Material Editor
- Integrated Layer Stackup (Metal and Dielectric Layer) Editor
- Accommodating layered media with any number of dielectric/metal layers
- Designations of some metal layers to be connected to the ground (GND)
- Allowing any number of traces on any metal layers (except GND layers) with
customized width and spacing rules - Calculations of RLGC matrices and the derived impedance matrix
- Export RLGC parameters to W-element files compatible with HSPICE
- Export RLGC parameters to model file compatible with ADS
- File formats for storing material, layer stackup and trace design information
More detailed descriptions are available in the user's guide. Please read the license agreement before downloading. The current distribution has an expiration date of December 27, 2010. After that date, the application will impose a restriction of calculating up to only two traces. For academic users, EE Circle offers a free license (that will retain full functionalities) upon request.
Click one of the following links for downloading the Trace Analyzer application:
- Trace Analyzer 1.0 .1
- Mac OS-X installer
- Windows installer
- Linux and UNIX installer (unzip to get a runnable jar file)
When help is needed, please read the installtion help.
Note: Some web browser may change the file extension from "jar" to "zip". Please change it back to "jar" if necessary. You need to have Java (JDK 1.5 or higher) to run this installer.
