Pseudo-Random Binary Sequence (PRBS) by a Linear-Feedback Shift Register (LFSR) with a (2N-1) Period

Brief User' Guide

Reference

Paul H. Bardell, William H. McAnney, and Jacob Savir, "Built-In Test for VLSI: Pseudorandom Techniques", John Wiley & Sons, New York, 1987.


Disclaimer


© Copyright 2001-2007 EE Circle


Goto other applets